DocumentCode :
3558959
Title :
Leave-One-Out-Training and Leave-One-Out-Testing Hidden Markov Models for a Handwritten Numeral Recognizer: The Implications of a Single Classifier and Multiple Classifications
Author :
Ko, Albert Hung-Ren ; Cavalin, Paulo Rodrigo ; Sabourin, Robert ; de Souza Britto, Alceu
Author_Institution :
Univ. of Toronto, Toronto, ON, Canada
Volume :
31
Issue :
12
fYear :
2009
Firstpage :
2168
Lastpage :
2178
Abstract :
Hidden Markov models (HMMs) have been shown to be useful in handwritten pattern recognition. However, owing to their fundamental structure, they have little resistance to unexpected noise among observation sequences. In other words, unexpected noise in a sequence might ldquo breakrdquo the normal transmission of states for this sequence, making it unrecognizable to trained models. To resolve this problem, we propose a leave-one-out-training strategy, which will make the models more robust. We also propose a leave-one-out-testing method, which will compensate for some of the negative effects of this noise. The latter is actually an example of a system with a single classifier and multiple classifications. Compared with the 98.00 percent accuracy of the benchmark HMMs, the new system achieves a 98.88 percent accuracy rate on handwritten digits.
Keywords :
handwritten character recognition; hidden Markov models; pattern classification; HMM; handwritten digits; handwritten numeral recognizer; handwritten pattern recognition; hidden Markov models; leave-one-out-testing; leave-one-out-training; multiple classification; noise; single classifier; Classifier design and evaluation; Handwriting analysis; Hidden Markov Models; Optical character recognition; Pattern Recognition; Structural; ensemble of classifiers; leave one out; noise; pattern recognition.; sequence;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
Conference_Location :
10/17/2008 12:00:00 AM
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/TPAMI.2008.254
Filename :
4653498
Link To Document :
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