DocumentCode :
3559170
Title :
Thermal, mechanical and dielectric properties of nanostructured epoxy-polyhedral oligomeric silsesquioxane composites
Author :
Takala, M. ; Karttunen, M. ; Pelto, J. ; Salovaara, P. ; Munter, T. ; Honkanen, M. ; Auletta, T. ; Kannus, K.
Author_Institution :
Inst. of Power Eng., Tampere Univ. of Technol., Tampere
Volume :
15
Issue :
5
fYear :
2008
fDate :
10/1/2008 12:00:00 AM
Firstpage :
1224
Lastpage :
1235
Abstract :
This paper presents the results of the thermal, mechanical and dielectric measurements conducted on polymer nanocomposites consisting of epoxy and polyhedral oligomeric silsesquioxane (POSS). The material composites were analyzed with a scanning electron microscope (SEM), an atomic force microscope (AFM) and a transmission electron microscope (TEM). Glass transition temperatures of the composites were measured with differential scanning calorimeter (DSC). Stress, strain, modulus and impact strength of epoxy nanocomposites were tested. Ac and lightning impulse (LI) breakdown strength of the composites were measured. Relative permittivity, loss factor and volume resistivity measurements were also conducted on the material samples. Two types of POSS, glycidyl and octaglycidyldimethylsilyl, were used in different quantities. Statistical analysis was applied to the measurement results to determine the effects of the additive type and amount on the properties of epoxy. The paper discusses the possibilities and restrictions in order to achieve advantages in high voltage applications using polyhedral oligomeric silsesquioxanes.
Keywords :
atomic force microscopy; dielectric losses; differential scanning calorimetry; elastic moduli; glass transition; nanostructured materials; permittivity; polymers; scanning electron microscopy; statistical analysis; transmission electron microscopy; atomic force microscope; dielectric measurement; differential scanning calorimeter; elastic modulus; glass transition temperatures; impact strength; lightning impulse breakdown strength; loss factor; mechanical measurement; nanostructured epoxy-polyhedral oligomeric silsesquioxane composites; relative permittivity; scanning electron microscope; statistical analysis; thermal measurement; transmission electron microscope; volume resistivity measurements; Atomic force microscopy; Conducting materials; Dielectric measurements; Mechanical factors; Nanocomposites; Permittivity measurement; Polymers; Scanning electron microscopy; Thermal conductivity; Transmission electron microscopy; Epoxy; dielectric properties; mechanical; polyhedral oligomeric silsesquioxane; thermal;
fLanguage :
English
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher :
ieee
Conference_Location :
10/1/2008 12:00:00 AM
ISSN :
1070-9878
Type :
jour
DOI :
10.1109/TDEI.2008.4656229
Filename :
4656229
Link To Document :
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