• DocumentCode
    3559290
  • Title

    The State of ESL Design [Roundtable]

  • Author

    Bergamaschi, Reinaldo ; Benini, Luca ; Flautner, Krisztian ; Kruijtzer, Wido ; Sangiovanni-Vincentelli, Alberto ; Wakabayashi, Kazutoshi

  • Volume
    25
  • Issue
    6
  • fYear
    2008
  • Firstpage
    510
  • Lastpage
    519
  • Abstract
    This is the first of two roundtables on electronic system-level design in this issue of IEEE Design & Test. ESL design and tools have been present in the design landscape for many years. Significant ESL innovations are now part of most advanced design methodologies, spanning the domains of modeling, simulation, and synthesis. Techniques such as transaction-level modeling, automatic interconnection generation, behavioral synthesis, automatic instruction-set customization, retargetable compilers, and many others are currently used in the design of multimillion-gate chips. Yet, ESL design still seems to struggle to live up to the promise of providing increased productivity and design quality. This roundtable examines these issues and attempts to provide a definite picture of where ESL design is today and where it might be in the next five to 10 years. The participants in this roundtable include well-known experts in ESL design from the user side, universities, and tool providers. IEEE Design & Test thanks the roundtable participants: moderator Reinaldo Bergamaschi (CadComponents), Luca Benini (University of Bologna), Krisztian Flautner (ARM UK), Wido Kruijtzer (NXP Semiconductors), Alberto Sangiovanni-Vincentelli (University of California, Berkeley), and Kazutoshi Wakabayashi (NEC Japan). D&T gratefully acknowledges the help of Roundtables Editor Bill Joyner (Semiconductor Research Corp.), who organized the event.
  • Keywords
    Design methodology; Educational institutions; Electronic equipment testing; LAN interconnection; National electric code; Productivity; Semiconductor device testing; System testing; System-level design; Technological innovation;
  • fLanguage
    English
  • Journal_Title
    Design Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2008.172
  • Filename
    4702875