DocumentCode :
3559316
Title :
Modeling, Analysis, and Application of Leakage Induced Damping Effect for Power Supply Integrity
Author :
Gu, Jie ; Keane, John ; Kim, Chris H.
Author_Institution :
Res. Center for Adv. Sci. & Technol., Univ. of Tokyo, Tokyo
Volume :
17
Issue :
1
fYear :
2009
Firstpage :
128
Lastpage :
136
Abstract :
Leakage power is becoming the dominant component of chip power consumption with continued CMOS scaling. An important but commonly unnoticed fact is that leaky transistors act as resistors that help dampen the mid-frequency power supply noise. This paper focuses on the damping effect of various on-chip current components including the leakage current which becomes significant in scaled technologies. By developing physics-based damping models for active and leakage currents, we show that leakage, particularly gate tunneling leakage, provides more damping than strong-inversion current. The proposed models were validated in a 32-nm predictive CMOS technology under process-voltage-temperature (PVT) variations. Examples on large circuits such as SRAM caches are shown to illustrate the application of the proposed model. Simulation results show that the leakage induced damping effect can compensate the speed degradation at high temperatures by 7% or offer 61% saving in decap area and leakage power.
Keywords :
CMOS integrated circuits; damping; integrated circuit modelling; power integrated circuits; power semiconductor devices; power supply circuits; CMOS scaling; CMOS technology; SRAM caches; gate tunneling leakage; leakage induced damping effect; leakage power; mid-frequency power supply noise; on-chip current components; power supply integrity; process-voltage-temperature variations; size 32 nm; Circuit modeling; integrated circuit (IC) design; leakage currents; power supply noise;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
Conference_Location :
12/9/2008 12:00:00 AM
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2008.2001300
Filename :
4703195
Link To Document :
بازگشت