DocumentCode :
3559527
Title :
On the Probabilistic Characterization of Nano-Based Circuits
Author :
Lu, Xiaojun ; Li, Jianping ; Zhang, Wenyin
Author_Institution :
Sch. of Comput., Univ. of Electron. Sci. & Technol. of China, Chengdu
Volume :
8
Issue :
2
fYear :
2009
fDate :
3/1/2009 12:00:00 AM
Firstpage :
258
Lastpage :
259
Abstract :
The paper presents a novel probabilistic logical model to describe the nanodevice states. It describes the probability distribution of outputs. The model is based on observations on statistical physics and Markov random field. Different from previous model [Bahar (2004), Nano, Quantum and Molecular Computing: Implications to High Level Design and Validation, S. Shukla and R. I. Bahar, Eds. Norwell, MA: Kluwer], it uses probability density function to describe the probability behavior of the nanoscale circuits, which is more reasonable and flexible.
Keywords :
nanoelectronics; statistical distributions; Markov random field; nanobased circuits; nanodevice states; probabilistic logical model; probability density function; probability distribution; Markov random field (MRF); nanocircuit; probability logic;
fLanguage :
English
Journal_Title :
Nanotechnology, IEEE Transactions on
Publisher :
ieee
Conference_Location :
12/12/2008 12:00:00 AM
ISSN :
1536-125X
Type :
jour
DOI :
10.1109/TNANO.2008.2010905
Filename :
4711106
Link To Document :
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