Title :
On the Probabilistic Characterization of Nano-Based Circuits
Author :
Lu, Xiaojun ; Li, Jianping ; Zhang, Wenyin
Author_Institution :
Sch. of Comput., Univ. of Electron. Sci. & Technol. of China, Chengdu
fDate :
3/1/2009 12:00:00 AM
Abstract :
The paper presents a novel probabilistic logical model to describe the nanodevice states. It describes the probability distribution of outputs. The model is based on observations on statistical physics and Markov random field. Different from previous model [Bahar (2004), Nano, Quantum and Molecular Computing: Implications to High Level Design and Validation, S. Shukla and R. I. Bahar, Eds. Norwell, MA: Kluwer], it uses probability density function to describe the probability behavior of the nanoscale circuits, which is more reasonable and flexible.
Keywords :
nanoelectronics; statistical distributions; Markov random field; nanobased circuits; nanodevice states; probabilistic logical model; probability density function; probability distribution; Markov random field (MRF); nanocircuit; probability logic;
Journal_Title :
Nanotechnology, IEEE Transactions on
Conference_Location :
12/12/2008 12:00:00 AM
DOI :
10.1109/TNANO.2008.2010905