Title :
Oscillatory Transmission Line Pulsing for Characterization of Device Transient Response
Author :
Di Sarro, James P. ; Rosenbaum, Elyse
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL
Abstract :
An oscillatory transmission line pulse generation system is introduced. This measurement system allows one to observe the response of an electrostatic discharge (ESD) protection device to a large-amplitude radio-frequency damped sinusoid; such waveforms mimic ESD tests. The trigger voltage of silicon-controlled rectifiers used for ESD protection is observed to be dependent on the past state of the device, due to charge storage in the bipolar bases.
Keywords :
electrostatic discharge; rectifying circuits; semiconductor devices; transient response; transmission lines; device transient response; electrostatic discharge protection device; large-amplitude radio-frequency damped sinusoid; oscillatory transmission line pulse generation system; silicon-controlled rectifier; trigger voltage; Electrostatic discharge (ESD); silicon-controlled rectifier (SCR); transmission line pulsing (TLP);
Journal_Title :
Electron Device Letters, IEEE
Conference_Location :
12/12/2008 12:00:00 AM
DOI :
10.1109/LED.2008.2009361
