DocumentCode :
3559930
Title :
Closed-Loop Modeling in Future Automation System Engineering and Validation
Author :
Vyatkin, Valeriy ; Hanisch, Hans-Michael ; Pang, Cheng ; Yang, Chia-Han
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Auckland, Auckland
Volume :
39
Issue :
1
fYear :
2009
Firstpage :
17
Lastpage :
28
Abstract :
This paper presents a new framework for design and validation of industrial automation systems based on systematic application of formal methods. The engineering methodology proposed in this paper is based on the component design of automated manufacturing systems from intelligent mechatronic components. Foundations of such componentspsila information infrastructure are the new IEC 61499 architecture and the automation object concept. It is illustrated in this paper how these architectures, in conjunction with other advanced technologies, such as Unified Modeling Language, Simulink, and net condition/event systems, form a framework that enables pick-and-place design, simulation, formal verification, and deployment with the support of a suite of software tools. The key feature of the framework is the inherent support of formal validation techniques achieved on account of automated transformation among different system models. The paper appeals to developers of automation systems and automation software tools via showing the pathway to improve the system development practices by combining several design and validation methodologies and technologies.
Keywords :
factory automation; formal verification; production engineering computing; software tools; IEC 61499 architecture; automated manufacturing systems; closed-loop modeling; formal methods; formal validation techniques; formal verification; future automation system engineering; industrial automation systems; intelligent mechatronic components; software tools; Manufacturing automation; mechatronics; software reusability; software verification and validation (V&V);
fLanguage :
English
Journal_Title :
Systems, Man, and Cybernetics, Part C: Applications and Reviews, IEEE Transactions on
Publisher :
ieee
Conference_Location :
12/16/2008 12:00:00 AM
ISSN :
1094-6977
Type :
jour
DOI :
10.1109/TSMCC.2008.2005785
Filename :
4717249
Link To Document :
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