Comparison of a Multichip 10-V Programmable Josephson Voltage Standard System With a Superconductor–Insulator–Superconductor-Based Conventional System

Author

Yamada, Takahiro ; Murayama, Yasushi ; Yamamori, Hirotake ; Sasaki, Hitoshi ; Shoji, Akira ; Iwasa, Akio ; Nishinaka, Hidefumi ; Nakamura, Yasuhiro

Author_Institution

Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba

Volume

58

Issue

4

fYear

2009

fDate

4/1/2009 12:00:00 AM

Firstpage

832

Lastpage

837

Abstract

We developed a 10-V dc programmable Josephson voltage standard (PJVS) using a multichip technique. The PJVS was based on NbN/TiN_x/NbN junctions and operated using a 10-K compact cryocooler. We carried out an indirect comparison with a superconductor-insulator-superconductor-based conventional Josephson voltage standard (JVS) by measuring the voltage of a 10-V zener diode reference standard. The combined standard uncertainty of the comparison was u _c = 0.03 muV(k = 1), and the relative combined standard uncertainty was 3 times10^-9.

Keywords

Zener diodes; measurement standards; measurement uncertainty; multichip modules; superconductor-insulator-superconductor devices; voltage measurement; compact cryocooler; multichip technique; programmable Josephson voltage standard system; standard uncertainty; superconductor-insulator-superconductor; voltage 10 V; voltage measuring; zener diode reference standard; Digital–analog conversion; Digital–analog conversion; Josephson junctions (JJs); multichip modules; standards; uncertainty; voltage; zener diodes;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

Conference_Location

12/16/2008 12:00:00 AM

ISSN

0018-9456

Type

jour

DOI

10.1109/TIM.2008.2008580

Filename

4717270