• DocumentCode
    3560051
  • Title

    Excellent Low Loss Performance of Microwave Permeability in High Resistive CoFeHfO Films by Thermal Annealing

  • Author

    Kim, Dong Young ; Yoon, Seok Soo ; Rao, B. Parvatheeswara ; Kim, CheolGi ; Kim, Ki Hyeon ; Takahashi, M.

  • Author_Institution
    Dept. of Phys., Andong Nat. Univ., Andong
  • Volume
    44
  • Issue
    11
  • fYear
    2008
  • Firstpage
    3115
  • Lastpage
    3118
  • Abstract
    This paper reports on the thermal field annealing effect of microwave permeabilities in CoFeHfO thin films. For the high resistive optimized Co19Fe53Hf8O20 thin films annealed at 150deg C, apart from excellent magnetic performance very low Gilbert damping constants (alpha < 0.017) are obtained up to film thickness of 437 nm. The results are interpreted in terms of changes in microstructure leading to structural relaxation effect and evolution of nanocrystalline Co(Fe) precipitates out of thermal field annealing. These materials with excellent low loss performance are obviously the most promising candidates for microwave device applications.
  • Keywords
    annealing; cobalt compounds; damping; insulating thin films; iron compounds; nanostructured materials; permeability; precipitation; Co19Fe53Hf8O20; Gilbert damping constants; high resistive films; microstructure; microwave device applications; microwave permeability; nanocrystals; precipitation; structural relaxation effect; temperature 150 C; thermal annealing; Amorphous; CoFeHfO; low loss; microwave permeability;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2008.2001627
  • Filename
    4717385