DocumentCode
3560051
Title
Excellent Low Loss Performance of Microwave Permeability in High Resistive CoFeHfO Films by Thermal Annealing
Author
Kim, Dong Young ; Yoon, Seok Soo ; Rao, B. Parvatheeswara ; Kim, CheolGi ; Kim, Ki Hyeon ; Takahashi, M.
Author_Institution
Dept. of Phys., Andong Nat. Univ., Andong
Volume
44
Issue
11
fYear
2008
Firstpage
3115
Lastpage
3118
Abstract
This paper reports on the thermal field annealing effect of microwave permeabilities in CoFeHfO thin films. For the high resistive optimized Co19Fe53Hf8O20 thin films annealed at 150deg C, apart from excellent magnetic performance very low Gilbert damping constants (alpha < 0.017) are obtained up to film thickness of 437 nm. The results are interpreted in terms of changes in microstructure leading to structural relaxation effect and evolution of nanocrystalline Co(Fe) precipitates out of thermal field annealing. These materials with excellent low loss performance are obviously the most promising candidates for microwave device applications.
Keywords
annealing; cobalt compounds; damping; insulating thin films; iron compounds; nanostructured materials; permeability; precipitation; Co19Fe53Hf8O20; Gilbert damping constants; high resistive films; microstructure; microwave device applications; microwave permeability; nanocrystals; precipitation; structural relaxation effect; temperature 150 C; thermal annealing; Amorphous; CoFeHfO; low loss; microwave permeability;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2008.2001627
Filename
4717385
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