Title :
Comparative Study of Magnetic Ordering in Bulk and Nano-Grained La
Ca
MnO
Author :
Rozenberg, E. ; Auslender, M. ; Shames, A.I. ; Felner, I. ; Sominski, E. ; Gedanken, A. ; Pestun, A. ; Mukovskii, Ya.M.
Author_Institution :
Dept. of Phys., BGU of the Negev, Beer-Sheva
Abstract :
To explore the size effect in electron-doped La0.4Ca0.6MnO3 (LCMO) compound, dc magnetic measurements and electron magnetic resonance were carried out with bulk and nano-grained LCMO in temperature ranges 5 K les T les 350 K and 5 K les T les 600 K, respectively. It appears that the antiferromagnetic, charge ordered state remains stable upon the reduction of the samples size down to nanometer scale. However, the low-temperature ferromagnetic (FM) component enhances in nano-grained LCMO as compared to its bulk counterpart, supposedly due to strong surface and inter-grain interaction effects. FM correlations in bulk and nano crystals are strong at paramagnetic (PM) state, which seems to be an electron-doping effect. The domination of ion-ion spin relaxation mechanism in PM state and drastic fading of the FM correlations upon cooling means that the doped electrons are localized in both bulk and nano-grained LCMO. The notable influence of the oxygen stoichiometry on magnetic ordering in LCMO, revealed in this work, may explain the contradictive data on the magnetic state of nano-crystalline LCMO reported in the literature.
Keywords :
antiferromagnetic materials; calcium compounds; charge-ordered states; lanthanum compounds; magnetic resonance; magnetisation; nanostructured materials; paramagnetism; size effect; stoichiometry; La0.4Ca0.6MnO3; antiferromagnetic material; charge ordered state; electron magnetic resonance; electron-doped compound; intergrain interaction effects; ion-ion spin relaxation mechanism; magnetic ordering; magnetization; nanograined manganite; oxygen stoichiometry; paramagnetic state; temperature 5 K to 600 K; Magnetic resonance; magnetization processes; manganese compounds; nanotechnology;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2008.2002197