A technique for fast transient statistical simulation of analog circuits

Author

López-Ahumada, R. ; Rodríguez-Macias, R.

Author_Institution

Escuela Politecnica Superior, Huelva Univ., Spain

Volume

1

fYear

1999

fDate

1999

Firstpage

64

Abstract

A technique is presented to evaluate mean values and standard deviations of transient analog cell specifications under random fluctuations of the primitive component parameters. Its precision and generality are similar to those of Monte Carlo analysis of electrical simulations while its CPU time is considerably smaller. The advantages of the proposed technique are demonstrated via the statistical evaluation of two CMOS cells

Keywords

CMOS analogue integrated circuits; analogue integrated circuits; cellular arrays; circuit simulation; statistical analysis; transient analysis; CMOS cells; CPU time; analog circuits; electrical simulations; fast transient statistical simulation; mean values; primitive component parameters; random fluctuations; standard deviations; statistical evaluation; transient analog cell specifications; Analog circuits; Analytical models; Capacitors; Central Processing Unit; Circuit simulation; Fabrication; Fluctuations; Impedance; Monte Carlo methods; Resistors;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 1999. 42nd Midwest Symposium on

Conference_Location

Las Cruces, NM

Print_ISBN

0-7803-5491-5

Type

conf

DOI

10.1109/MWSCAS.1999.867210

Filename

867210