Title :
Texture Effects in IrMn/CoFe Exchange Bias Systems
Author :
Aley, N.P. ; Vallejo-Fernandez, G. ; Kroeger, R. ; Lafferty, B. ; Agnew, J. ; Lu, Y. ; O´Grady, K.
Author_Institution :
Dept. of Phys., Univ. of York, York
Abstract :
We report an enhancement of the average blocking temperature <TB> in IrMn/CoFe exchange bias systems due to an increase in the anisotropy constant of the IrMn. This is related to a (111) texture of IrMn parallel to the interface. Si<100>/Seed (5 nm)/IrMn (10 nm)/CoFe (3 nm)/Ta (10 nm) were prepared by dc sputtering. Cu, Ru, and NiCr seed layers were used. X-ray diffraction studies involving both thetas/2thetas and grazing incidence scans revealed a strong (111) texture of the IrMn parallel to the interface for the samples with a NiCr seed layer. Cu and Ru seed layers did not cause a marked texture. Thermal activation measurements found an enhancement of the average blocking temperature from 367 K for the sample with Cu seed layer to 477 K for the sample with a NiCr seed. The anisotropy constant was found to increase from (2.8plusmn0.2) times 106 erg/cm3 for the sample with a Cu seed layer to (3.3 plusmn 0.4) times 107 erg/cm3 for the sample with a NiCr seed layer. We find that the increase in the anisotropy constant leads to an enhanced blocking temperature.
Keywords :
X-ray diffraction; antiferromagnetic materials; chromium alloys; cobalt alloys; copper; exchange interactions (electron); interface magnetism; iridium alloys; iron alloys; magnetic anisotropy; magnetic thin films; manganese alloys; nickel alloys; ruthenium; silicon; tantalum; texture; tunnelling magnetoresistance; Si-IrMn-CoFe-Ta-Cu; Si-IrMn-CoFe-Ta-NiCr; Si-IrMn-CoFe-Ta-Ru; X-ray diffraction; anisotropy constant; antiferromagnetic layer; average blocking temperature; dc sputtering; exchange bias systems; grazing incidence; seed layers; temperature 367 K to 477 K; texture effects; thermal activation; tunneling magnetoresistance; Anisotropy; IrMn; exchange bias; thermal activation;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2008.2001317