DocumentCode :
3560311
Title :
Magnetic Properties and Crystallographic Structure of Fe _{3} Pt Thin Films
Author :
Hsiao, S.N. ; Chen, S.K. ; Hsu, Y.W. ; Yuan, F.T. ; Huang, H.W. ; Chin, T.S. ; Chang, W.C. ; Lee, H.Y.
Author_Institution :
Dept. of Mater. Sci. & Eng., Feng Chia Univ., Taichung
Volume :
44
Issue :
11
fYear :
2008
Firstpage :
3902
Lastpage :
3905
Abstract :
Fe100-xPtx (x = 20, 25, and 30) thin films with nominal thickness 50 nm were prepared by radio-frequency (RF) magnetron sputtering onto glass substrates. Crystallographic structure and magnetic properties of such films were investigated by varying Fe content, annealing temperature (400-700degC), and heating process. Crystallographic structure obtained by X-ray diffraction (XRD) indicated that ordering of L12 Fe3Pt phase takes place for Fe75Pt25 postannealed above 400degC. Ordering parameter of the Fe75Pt25 sample increases from 0.29 to 0.94 as annealing temperature rises from 400degC to 700degC. Saturation magnetization 1270 emu/cm3 was obtained in Fe75Pt25 films annealed at 700degC. Fe70Pt30 films annealed at 700degC show similar characteristics with those of Fe75Pt25, while Fe80Pt20 films exhibit paramagnetism due to disordered Fe-rich face-centered cubic (fcc) structure. Postannealing seems necessary for formation of pure L12 Fe3Pt phase while in situ annealing leads to formation of a metastable tetragonal Fe3Pt phase, as confirmed by XRD.
Keywords :
X-ray diffraction; annealing; crystal structure; iron alloys; magnetic thin films; magnetisation; metallic thin films; paramagnetic materials; platinum alloys; sputter deposition; Fe3Pt; X-ray diffraction; XRD; annealing; crystallographic structure; heating; magnetic properties; paramagnetism; radiofrequency magnetron sputtering; saturation magnetization; temperature 400 degC to 700 degC; thin films; $L1_{2}$ superlattice; Coercivity; Fe$_{3}$Pt thin films; metastable phase; phase transformation; saturation magnetization;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2008.2002253
Filename :
4717672
Link To Document :
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