Title :
Intrinsic Threshold Current Density of Domain Wall Motion in Nanostrips With Perpendicular Magnetic Anisotropy for Use in Low-Write-Current MRAMs
Author :
Fukami, Shunsuke ; Suzuki, Tetsuhiro ; Ohshima, Norikazu ; Nagahara, Kiyokazu ; Ishiwata, Nobuyuki
Author_Institution :
Device Platforms Res. Labs., NEC Corp., Sagamihara
Abstract :
In this paper, we have calculated the intrinsic threshold current density of domain wall (DW) motion in nanostrips with perpendicular magnetic anisotropy (PMA) and have estimated writing properties of magnetic random access memories (MRAMs) with DW motion. Carrying out a micromagnetic simulation, we revealed that the intrinsic threshold current density decreases with decreases in the strip thickness, width, and magnetization, whereas it did not depend significantly on magnetocrystalline anisotropy and exchange stiffness. These results showed good agreement with one-dimensional (1-D) analysis. We also found that current-induced DW motion in PMA strips may have potential for use in low-write-current MRAMs. For a width of less than roughly 100 nm, comparable properties to those of existing memories can be obtained.
Keywords :
MRAM devices; exchange interactions (electron); magnetic domain walls; magnetisation; perpendicular magnetic anisotropy; 1D analysis; domain wall motion; exchange stiffness; intrinsic threshold current density; low-write-current MRAMs; magnetic random access memories; magnetization; magnetocrystalline anisotropy; micromagnetic simulation; nanostrips; perpendicular magnetic anisotropy; strip thickness; writing properties; Current-induced domain wall (DW) motion; magnetic random access memory (MRAM); micromagnetic simulation; perpendicular magnetic anisotropy (PMA);
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2008.2002370