DocumentCode :
3560396
Title :
Magnetoresistance in Co/ZnO Films
Author :
Li, Xiao-Li ; Quan, Zhi-Yong ; Xu, Xiao-Hong ; Wu, Hai-Shun ; Gehring, G.A.
Author_Institution :
Sch. of Chem. & Mater. Sci., Shanxi Normal Univ., Linfen
Volume :
44
Issue :
11
fYear :
2008
Firstpage :
2684
Lastpage :
2687
Abstract :
[Co(0.6 nm)/ZnO( x nm)] 60 (x=0.3 - 3) films were deposited on glass substrates by magnetron sputtering, and then annealed in vacuum. The large negative magnetoresistance of -10.4% is observed in the as-deposited [Co(0.6 nm)/ZnO(0.4 nm)] 60 film. When ZnO layer thickness is increased from 0.3 to 3 nm, MR ratios of the as-deposited Co/ZnO films are gradually decreased and MR ratios of the annealed films are increased, which might be attributed to the transformation of the structures from the multilayers to granular films during annealing. And the postannealing process makes the magnetism of the films transform from superparamagnetism to ferromagnetism due to Co precipitation in granular films after annealing.
Keywords :
annealing; cobalt; ferromagnetic materials; giant magnetoresistance; magnetic thin films; sputter deposition; superparamagnetism; zinc compounds; Co-ZnO; annealing; ferromagnetism; large negative magnetoresistance; magnetron sputtering; multilayers; precipitation; superparamagnetism; Annealing; magnetic semiconductor; magnetoresistance (MR); sputtering;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2008.2003238
Filename :
4717761
Link To Document :
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