• DocumentCode
    3560406
  • Title

    Local Probing of Magnetization Reversal in Ni–Fe Elliptical Dots With Variable Geometry

  • Author

    Endo, Y. ; Fujimoto, H. ; Nakatani, R. ; Yamamoto, M.

  • Author_Institution
    Dept. of Electr. & Commun. Eng., Tohoku Univ., Sendai
  • Volume
    44
  • Issue
    11
  • fYear
    2008
  • Firstpage
    3244
  • Lastpage
    3247
  • Abstract
    We have investigated the detailed magnetization reversal in 10-nm-thick Ni-Fe elliptical dots with several dot sizes using magnetic field sweeping (MFS)-magnetic force microscopy (MFM). At the dot edges, the shape of the phase (the stray field) curve versus magnetic field changes from a stepped hysteresis loop to a almost nonstepped hysteresis loop with increasing dot size. On the other hand, at the center within the dot, sharp or weak decreases in phase are observed as the magnetic field is varied. From these results, it is found that, in the magnetization reversal of a 10-nm-thick Ni-Fe elliptical dot with several dot sizes, the dominant factor changes from the change in the magnetic domain configuration to the domain wall motion as the length of major axis increases.
  • Keywords
    iron; magnetic domains; magnetic force microscopy; magnetic hysteresis; magnetisation reversal; nickel; MFM; MFS; Ni-Fe; elliptical dots; magnetic domain configuration; magnetic field sweeping; magnetic force microscopy; magnetization reversal; size 10 nm; Magnetic elliptical dot; magnetic force microscopy (MFM); magnetization reversal;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2008.2001620
  • Filename
    4717771