DocumentCode
3560406
Title
Local Probing of Magnetization Reversal in Ni–Fe Elliptical Dots With Variable Geometry
Author
Endo, Y. ; Fujimoto, H. ; Nakatani, R. ; Yamamoto, M.
Author_Institution
Dept. of Electr. & Commun. Eng., Tohoku Univ., Sendai
Volume
44
Issue
11
fYear
2008
Firstpage
3244
Lastpage
3247
Abstract
We have investigated the detailed magnetization reversal in 10-nm-thick Ni-Fe elliptical dots with several dot sizes using magnetic field sweeping (MFS)-magnetic force microscopy (MFM). At the dot edges, the shape of the phase (the stray field) curve versus magnetic field changes from a stepped hysteresis loop to a almost nonstepped hysteresis loop with increasing dot size. On the other hand, at the center within the dot, sharp or weak decreases in phase are observed as the magnetic field is varied. From these results, it is found that, in the magnetization reversal of a 10-nm-thick Ni-Fe elliptical dot with several dot sizes, the dominant factor changes from the change in the magnetic domain configuration to the domain wall motion as the length of major axis increases.
Keywords
iron; magnetic domains; magnetic force microscopy; magnetic hysteresis; magnetisation reversal; nickel; MFM; MFS; Ni-Fe; elliptical dots; magnetic domain configuration; magnetic field sweeping; magnetic force microscopy; magnetization reversal; size 10 nm; Magnetic elliptical dot; magnetic force microscopy (MFM); magnetization reversal;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2008.2001620
Filename
4717771
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