• DocumentCode
    35605
  • Title

    On the Assessment of the Life of SnAgCu Solder Joints in Cycling With Varying Amplitudes

  • Author

    Linlin Yang ; Liang Yin ; Arafei, Babak ; Roggeman, Brian ; Borgesen, P.

  • Author_Institution
    Dept. of Syst. Sci. & Ind. Eng., State Univ. of New York, Binghamton, NY, USA
  • Volume
    3
  • Issue
    3
  • fYear
    2013
  • fDate
    Mar-13
  • Firstpage
    430
  • Lastpage
    440
  • Abstract
    The long-term reliability of SnAgCu solder joints under actual field service conditions is far from well understood. Most accelerated cycling tests are restricted to constant amplitudes, whereas realistic environments usually involve varying amplitudes and/or more than one type of loading. Thus assessments of life as well as relative comparisons of alternatives in terms of life in service invariably have to rely on the assumption of a damage accumulation rule. This paper focuses on the life of SnAgCu solder joints in isothermal mechanical cycling with varying amplitudes. Test samples use representative solder material and geometry in electronic packaging industry. Experimental results show that the load sequence affects life significantly, reflecting deviations from a linear damage accumulation rule. Hardness and microstructure of solder material are studied after cyclic loading. The effect of load sequence could be explained by the damage evolution path and solder property change, which varied with cycling. Moreover, different levels of initial loading lead to changes in acceleration factors in subsequent shear fatigue cycling.
  • Keywords
    copper alloys; crystal microstructure; electronics packaging; fatigue; hardness; life testing; reliability; silver alloys; solders; tin alloys; SnAgCu; SnAgCu solder joints; accelerated cycling tests; actual field service conditions; constant amplitudes; cyclic loading; damage evolution path; electronic packaging industry; hardness; isothermal mechanical cycling; life assessment; linear damage accumulation rule; load sequence; long-term reliability; microstructure; representative solder material; shear fatigue cycling; varying amplitudes; Acceleration; Fatigue; Joints; Life estimation; Loading; Soldering; Stress; Damage accumulation rule; SnAgCu solder; life estimation; microstructure evolution;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2156-3950
  • Type

    jour

  • DOI
    10.1109/TCPMT.2013.2238234
  • Filename
    6423875