Title :
Magnetic Properties of Multilayer
Films
Author :
Chen, Shih-Yuan ; Yao, Yeong-Der ; Yu, Chin-Chung ; Chiang, D.P. ; Chen, Y.Y. ; Wu, Jenn-Ming
Author_Institution :
Dept. of Mater. Sci. & Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
fDate :
6/1/2010 12:00:00 AM
Abstract :
Multilayer [(FePt)x/Os]n films (with x being thickness in nm; Os with a fixed thickness 5 nm; n being the number of layers) have been deposited by ion-beam sputtering. Spacer layer was found to have substantial effects on the multilayers to exhibit different magnetic properties and microstructure. The average grain size of the multilayer films can be well controlled by both annealing temperature and thickness of the FePt layer with the Os space layer. The enhancement of Hc can be understood from the fact that for a FePt film with fixed thickness of Os spacer layer, the increasing number of Os spacer layer will inhibit the grain growth of FePt grains and enriches the grain boundary. The layer by layer structure of [(FePt)x/Os]n films can control the hard magnetic behaviors. Therefore, the multilayer [(FePt)x/Os]n films with Os as the spacer exhibit good hard magnetic properties and are attractive candidates for ultrahigh density magnetic recording media.
Keywords :
annealing; grain growth; grain size; iron alloys; magnetic hysteresis; magnetic multilayers; osmium; permanent magnets; platinum alloys; FePt-Os; annealing; grain boundary; grain growth; grain size; hard magnetic properties; hysteresis loops; ion-beam sputtering; layer by layer structure; magnetic properties; microstructure; multilayer films; size 5 nm; spacer layer; ultrahigh density magnetic recording media; Annealing; Grain size; Magnetic films; Magnetic multilayers; Magnetic properties; Microstructure; Size control; Sputtering; Temperature control; Thickness control; FePt; Os; grain; multilayer;
Journal_Title :
Magnetics, IEEE Transactions on
Conference_Location :
6/1/2010 12:00:00 AM
DOI :
10.1109/TMAG.2010.2040253