Variable input biasing as applied to pulse response testing of digital integrated circuits

Author

Pour-Mozafari, S. ; Beasley, Jeffrey ; Steine, R.

Author_Institution

Dept. of Electr. & Comput. Eng., New Mexico State Univ., Las Cruces, NM, USA

Volume

1

fYear

1999

fDate

1999

Firstpage

341

Abstract

This paper presents new test results for detecting defects in digital integrated circuits by the changes observed in the power on/off transient currents for device under test [DUT]. This technique is called i_DD Pulse Response Testing (i_DDPRT). Hardware test results for the Sandia National Laboratories SA3865 radhard emulation of the Intel 80C51BH micro-controller are presented which demonstrate the potential effectiveness of the test. Comparison of the power-on transient (rise time) and power of transient (fall time) using the mean and the variance as the classifier are presented. Also variable input biases are investigated and the results are presented

Keywords

digital integrated circuits; integrated circuit testing; microcontrollers; IDD pulse response testing; Intel 80C51BH microcontroller; SA3865; defect detection; digital integrated circuit; power on/off transient currents; radhard emulation; variable input biasing; Circuit testing; Digital integrated circuits; Hardware; Integrated circuit technology; Integrated circuit testing; Power engineering and energy; Power supplies; Probes; Pulse circuits; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 1999. 42nd Midwest Symposium on

Conference_Location

Las Cruces, NM

Print_ISBN

0-7803-5491-5

Type

conf

DOI

10.1109/MWSCAS.1999.867275

Filename

867275