Title :
Variable input biasing as applied to pulse response testing of digital integrated circuits
Author :
Pour-Mozafari, S. ; Beasley, Jeffrey ; Steine, R.
Author_Institution :
Dept. of Electr. & Comput. Eng., New Mexico State Univ., Las Cruces, NM, USA
Abstract :
This paper presents new test results for detecting defects in digital integrated circuits by the changes observed in the power on/off transient currents for device under test [DUT]. This technique is called iDD Pulse Response Testing (iDDPRT). Hardware test results for the Sandia National Laboratories SA3865 radhard emulation of the Intel 80C51BH micro-controller are presented which demonstrate the potential effectiveness of the test. Comparison of the power-on transient (rise time) and power of transient (fall time) using the mean and the variance as the classifier are presented. Also variable input biases are investigated and the results are presented
Keywords :
digital integrated circuits; integrated circuit testing; microcontrollers; IDD pulse response testing; Intel 80C51BH microcontroller; SA3865; defect detection; digital integrated circuit; power on/off transient currents; radhard emulation; variable input biasing; Circuit testing; Digital integrated circuits; Hardware; Integrated circuit technology; Integrated circuit testing; Power engineering and energy; Power supplies; Probes; Pulse circuits; Voltage;
Conference_Titel :
Circuits and Systems, 1999. 42nd Midwest Symposium on
Conference_Location :
Las Cruces, NM
Print_ISBN :
0-7803-5491-5
DOI :
10.1109/MWSCAS.1999.867275
