DocumentCode
3560641
Title
On the Second-Order Statistics of the EVD of Sample Covariance Matrices—Application to the Detection of Noncircular Or/and NonGaussian Components
Author
Delmas, Jean Pierre ; Meurisse, Yann
Author_Institution
Dept. CITI, TELECOM SudParis, Evry, France
Volume
59
Issue
8
fYear
2011
Firstpage
4017
Lastpage
4023
Abstract
This correspondence presents an asymptotic analysis of the eigenvalue decomposition (EVD) of the sample covariance matrix associated with independent identically distributed (i.i.d.) non necessarily circular and Gaussian data that extends the well known analysis presented in the literature for circular and Gaussian data. Closed-form expressions of the asymptotic bias and variance of the sample eigenvalues and eigenvectors are given. As an application of these extended expressions, the statistical performance analysis of the widely used minimum description length (MDL) criterion applied to the detection of the number of noncircular or/and non-Gaussian sources impinging on an array of sensors is considered with a particular attention paid to uncorrelated rectilinear sources.
Keywords
Gaussian distribution; array signal processing; covariance matrices; eigenvalues and eigenfunctions; higher order statistics; Gaussian data; asymptotic analysis; asymptotic bias; closed-form expressions; covariance matrices; eigenvalue decomposition; eigenvalues and eigenvectors; minimum description length; nonGaussian components; nonGaussian sources; noncircular components; rectilinear sources; second-order statistics; sensors array; statistical performance analysis; Arrays; Binary phase shift keying; Covariance matrix; Eigenvalues and eigenfunctions; Gaussian distribution; Sensors; Signal to noise ratio; Asymptotic performance analysis; eigenvalue; eigenvalue decomposition (EVD); eigenvector; minimum description length (MDL); non-Gaussian; noncircular; rectilinear sources; sample covariance matrix; source detection;
fLanguage
English
Journal_Title
Signal Processing, IEEE Transactions on
Publisher
ieee
Conference_Location
4/21/2011 12:00:00 AM
ISSN
1053-587X
Type
jour
DOI
10.1109/TSP.2011.2145375
Filename
5753951
Link To Document