Title :
CMOS Programmable Gain Distributed Amplifier With 0.5-dB Gain Steps
Author :
Hur, Byul ; Eisenstadt, William R.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Florida, Gainesville, FL, USA
fDate :
6/1/2011 12:00:00 AM
Abstract :
A new CMOS programmable gain distributed amplifier with 0.5-dB gain steps is fabricated in a 130-nm process. The circuit is designed to demonstrate broadband (>;1 decade) programmable gains with excellent matching and high isolation for use in RF integrated-circuit testing. The measured slope of S21 loss is approximately 3 dB/decade over frequencies from 0.8 to 9 GHz where input and output return losses are better than roughly 10 dB; the measured input 1-dB compression point and third-order intermodulation intercept point at 2.78 GHz for the maximum 2.5-dB gain is 1 and 12.5 dBm, respectively. The measured noise figure is below 9.5 dB at 9 GHz. The circuit consumes approximately 40 mW total from 3.1-V analog and 1.5-V digital supplies.
Keywords :
CMOS analogue integrated circuits; distributed amplifiers; integrated circuit design; integrated circuit testing; intermodulation; programmable circuits; radiofrequency integrated circuits; CMOS programmable gain distributed amplifier; RF integrated-circuit testing; broadband programmable gain; circuit design; compression point; frequency 0.8 GHz to 9 GHz; gain 0.5 dB; size 130 nm; slope measurement; third-order intermodulation intercept point; Capacitance; Digital control; Gain; Gain control; Impedance matching; Semiconductor device measurement; Transconductance; Automatic test equipment (ATE); RF amplifiers; broadband amplifiers; built-in self-test; distributed amplifiers; gain control; microwave amplifiers; ultra-wideband (UWB) technology;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Conference_Location :
4/21/2011 12:00:00 AM
DOI :
10.1109/TMTT.2011.2131675