• DocumentCode
    3560660
  • Title

    CMOS Programmable Gain Distributed Amplifier With 0.5-dB Gain Steps

  • Author

    Hur, Byul ; Eisenstadt, William R.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Florida, Gainesville, FL, USA
  • Volume
    59
  • Issue
    6
  • fYear
    2011
  • fDate
    6/1/2011 12:00:00 AM
  • Firstpage
    1552
  • Lastpage
    1559
  • Abstract
    A new CMOS programmable gain distributed amplifier with 0.5-dB gain steps is fabricated in a 130-nm process. The circuit is designed to demonstrate broadband (>;1 decade) programmable gains with excellent matching and high isolation for use in RF integrated-circuit testing. The measured slope of S21 loss is approximately 3 dB/decade over frequencies from 0.8 to 9 GHz where input and output return losses are better than roughly 10 dB; the measured input 1-dB compression point and third-order intermodulation intercept point at 2.78 GHz for the maximum 2.5-dB gain is 1 and 12.5 dBm, respectively. The measured noise figure is below 9.5 dB at 9 GHz. The circuit consumes approximately 40 mW total from 3.1-V analog and 1.5-V digital supplies.
  • Keywords
    CMOS analogue integrated circuits; distributed amplifiers; integrated circuit design; integrated circuit testing; intermodulation; programmable circuits; radiofrequency integrated circuits; CMOS programmable gain distributed amplifier; RF integrated-circuit testing; broadband programmable gain; circuit design; compression point; frequency 0.8 GHz to 9 GHz; gain 0.5 dB; size 130 nm; slope measurement; third-order intermodulation intercept point; Capacitance; Digital control; Gain; Gain control; Impedance matching; Semiconductor device measurement; Transconductance; Automatic test equipment (ATE); RF amplifiers; broadband amplifiers; built-in self-test; distributed amplifiers; gain control; microwave amplifiers; ultra-wideband (UWB) technology;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • Conference_Location
    4/21/2011 12:00:00 AM
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2011.2131675
  • Filename
    5753965