DocumentCode :
3560790
Title :
Analysis of Intensity and Frequency Noises in Semiconductor Optical Amplifier
Author :
Yamada, Minoru
Author_Institution :
Inst. of Sci. & Eng., Kanazawa Univ., Kanazawa, Japan
Volume :
48
Issue :
8
fYear :
2012
Firstpage :
980
Lastpage :
990
Abstract :
A theoretical analysis of the intensity and the frequency noise in semiconductor optical amplifiers (SOA) is given. Amplification of a traveling optical wave is formulated associating with fluctuations on the optical intensity, the optical phase, and the electron numbers based on the classical wave-equation and quantum mechanical modification. Inclusion of the amplified spontaneous emission generated in the SOA is also taken into account. Amounts of noise are expressed in terms of the relative intensity noise (RIN), the spectrum line-width, and the frequency noise. Sensitive dependency of the RIN property on the optical input power is theoretically explained. The RIN increases after passing the SOA, when the optical input power is small enough, but decreases when the optical input power is rather high. On the while, the spectrum line-width is found to be scarcely changed from the input light for conventional operation of the SOA.
Keywords :
laser noise; semiconductor optical amplifiers; spectral line breadth; superradiance; amplified spontaneous emission; classical wave equation; electron numbers; frequency noise; optical input power; optical phase; quantum mechanical modification; relative intensity noise; semiconductor optical amplifier; spectrum linewidth; traveling optical wave; Frequency modulation; Noise; Optical noise; Optical sensors; Semiconductor optical amplifiers; Stimulated emission; Line-width; noise; semiconductor lasers; semiconductor optical amplifiers;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
Conference_Location :
5/3/2012 12:00:00 AM
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/JQE.2012.2197732
Filename :
6194257
Link To Document :
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