• DocumentCode
    3560814
  • Title

    A Wide Bandwidth Electronic Load

  • Author

    Upadhyay, Saurabh ; Mishra, Santanu ; Joshi, Avinash

  • Author_Institution
    Dept. of Electr. Eng., Indian Inst. of Technol., Kanpur, India
  • Volume
    59
  • Issue
    2
  • fYear
    2012
  • Firstpage
    733
  • Lastpage
    739
  • Abstract
    Electronic load (E-load) is commonly used to test power supplies. In order to test computer power supplies, the E-load must possess an ideal controlled current source property which draws a desired load current even in the case of a very low terminal voltage of the source under test (SUT). It also needs to have superior dynamic performance to simulate high-slew-rate load transients. This paper proposes the design of a switching-converter-based E-load with very large operational bandwidth. The overall architecture of the E-load consists of a low-bandwidth converter, which functions under steady state, and a high-bandwidth auxiliary circuit that is only active during transient state. The converter circuit is realized using a novel switched-boost topology, and the auxiliary circuit is realized using a MOSFET operating at the edge of saturation and linear region. The proposed topology is capable of sinking a specific amount of load current even with a very low SUT terminal voltage. Simulation and experimental validations are provided to verify the proposed concepts. A prototype has been built to test the proposed architecture. The operational input voltage (SUT voltage) ranges of the prototype are between 0.5 and 6 V. The load current range is between 0.75 and 7 A. The results validate the excellent dynamic characteristics of the proposed architecture.
  • Keywords
    built-in self test; computer power supplies; load (electric); MOSFET; SUT terminal voltage; boost topology; built to test; computer power supplies; current source property; high bandwidth auxiliary circuit; high slew rate load transients; load current range; operational input voltage; source under test; switching converter; test power supplies; wide bandwidth electronic load; Converters; MOSFET circuits; Power supplies; Steady-state; Switches; Transient analysis; Transistors; Boost converter; electronic load (E-load); ideal current source;
  • fLanguage
    English
  • Journal_Title
    Industrial Electronics, IEEE Transactions on
  • Publisher
    ieee
  • Conference_Location
    5/2/2011 12:00:00 AM
  • ISSN
    0278-0046
  • Type

    jour

  • DOI
    10.1109/TIE.2011.2148680
  • Filename
    5759738