Title :
Multilevel 3 Bit-per-cell Magnetic Random Access Memory Concepts and Their Associated Control Circuit Architectures
Author :
Cramman, Helen ; Eastwood, David S. ; King, Jennifer A. ; Atkinson, Del
Author_Institution :
Dept. of Phys., Durham Univ., Durham, UK
Abstract :
Designs for two novel multilevel magnetic random access memory (MRAM) concepts are presented in this paper along with their associated control circuit architectures. Both the ChiralMEM and 3-D-MRAM concepts contain eight states with distinct electrical resistances, giving a 3 bit-per-cell capacity. Operation of the two memory concepts are presented along with designs for the circuitry in particular focusing on the conversion of three conventional binary bits to octal encoded data and the required sequence for writing eight states per cell using current-driven magnetic fields. Discrimination and subsequent conversion of the eight readout resistance levels back to three conventional binary bits are discussed along with the write sequence for controlling arrays of multibit memory cells.
Keywords :
MRAM devices; electric resistance; memory architecture; readout electronics; 3 bit-per-cell capacity; 3D-MRAM concepts; ChiralMEM; associated control circuit architectures; conventional binary bits; current-driven magnetic fields; electrical resistances; multibit memory cells; multilevel 3 bit-per-cell magnetic random access memory concepts; multilevel magnetic random access memory concepts; octal encoded data; readout resistance levels; write sequence; Computer architecture; Magnetic tunneling; Magnetization; Microprocessors; Random access memory; Resistance; Tunneling magnetoresistance; 2-D- and 3-D-MRAM; Binary-octal conversion; control architecture; magnetic tunnel junction (MTJ) stacking; multibit memory;
Journal_Title :
Nanotechnology, IEEE Transactions on
Conference_Location :
5/5/2011 12:00:00 AM
DOI :
10.1109/TNANO.2011.2149538