Title :
Integrated outage information filter for the distribution system using intelligent method
Author :
Liu, Yan ; Schulz, Noel N.
Author_Institution :
Dept. of Electr. & Comput. Eng., Michigan Technol. Univ., Houghton, MI, USA
Abstract :
The main data source for lower distribution outages has been customer trouble calls. Developments in automated meter reading (AMR) systems and increased distribution SCADA are providing more metering information about the distribution system below the feeder breaker. However due to the complexity of the distribution system, no single data source can provide consistently accurate outage information. This paper discusses an intelligent outage data processing algorithm that will provide more accurate outage information for the estimation of fault locations by combining data from trouble call, AMR and distribution SCADA. The initial data validation is being developed to avoid nonoutage notifications. A fuzzy logic algorithm is then used to model uncertainty and to reconcile conflicting data. The filtered outage data could be used for outage location determination and system restoration for both nonstorm and storm conditions
Keywords :
SCADA systems; automatic meter reading; fault location; fuzzy logic; power distribution faults; storms; AMR systems; automated meter reading; conflicting data reconciliation; customer trouble calls; distribution SCADA; distribution outages; distribution system; fault locations estimation; feeder breaker; filtered outage data; fuzzy logic algorithm; integrated outage information filter; intelligent method; intelligent outage data processing algorithm; metering information; nonoutage notifications; nonstorm conditions; outage location determination; storm conditions; system restoration; uncertainty modeling; Automatic meter reading; Fuzzy logic; Information filtering; Information filters; Intelligent systems; Meter reading; Power system management; Power system restoration; Storms; Substations;
Conference_Titel :
Power Engineering Society Summer Meeting, 2000. IEEE
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-6420-1
DOI :
10.1109/PESS.2000.867357