DocumentCode :
3561073
Title :
A Novel Time Domain Method to Extract Equivalent Circuit Model of Patterned Ground Structures
Author :
Cheng, Chi-Hsuan ; Tsai, Chung-Hao ; Wu, Tzong-Lin
Author_Institution :
Dept. of Electr. of Eng., Nat. Taiwan Univ., Taipei, Taiwan
Volume :
20
Issue :
9
fYear :
2010
Firstpage :
486
Lastpage :
488
Abstract :
A novel and efficient time-domain method is proposed to extract the RLC equivalent circuit model of the patterned ground structure. Based on time domain reflection analysis and Laplace transform, two analytical equations are derived to compute the corresponding L and C values. The non-ideal effect of the excitation source and nonzero rising time in time domain reflectometry (TDR) measurement and analysis is also considered. The equivalent R due to the conductor loss of the slot is obtained by the steady state DC level in TDR waveform. Two test samples are fabricated on a Duroid substrate and a FR4 board to verify the accuracy of the extracting method. The extracted RLC models for these two cases have a good agreement with the full-wave simulation and measurement results both in the time domain and frequency domain.
Keywords :
Laplace transforms; equivalent circuits; frequency-domain analysis; microstrip lines; time-domain analysis; time-domain reflectometry; waveguide theory; Duroid substrate; FR4 board; Laplace transform; RLC equivalent circuit model; TDR waveform; conductor loss; frequency domain method; full-wave simulation; microstrip line; nonideal effect; patterned ground structures; steady state DC level; time domain reflection analysis; time domain reflectometry measurement; Conductors; Equivalent circuits; Frequency domain analysis; Frequency measurement; Laplace equations; Reflectometry; Steady-state; Testing; Time domain analysis; Time measurement; Defected ground structure (DGS); patterned ground structure (PGS); time domain reflectometry (TDR);
fLanguage :
English
Journal_Title :
Microwave and Wireless Components Letters, IEEE
Publisher :
ieee
Conference_Location :
6/7/2010 12:00:00 AM
ISSN :
1531-1309
Type :
jour
DOI :
10.1109/LMWC.2010.2051218
Filename :
5481986
Link To Document :
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