DocumentCode :
3561315
Title :
Lamb Waves and Resonant Modes in Rectangular-Bar Silicon Resonators
Author :
Casinovi, Giorgio ; Gao, Xin ; Ayazi, Farrokh
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Volume :
19
Issue :
4
fYear :
2010
Firstpage :
827
Lastpage :
839
Abstract :
This paper presents two newly developed models of capacitive silicon bulk acoustic resonators (SiBARs) characterized by a rectangular-bar geometry. The first model is derived from an approximate analytical solution of the linear elastodynamic equations for a parallelepiped made of an orthotropic material. This solution, which is recognized to represent a Lamb wave propagating across the width of the resonator, yields the frequencies and shapes of the resonance modes that typically govern the operation of SiBARs. The second model is numerical and is based on a finite-element multiphysics simulation of both acoustic wave propagation in the resonator and electromechanical transduction in the capacitive gaps of the device. It is especially useful in the computation of the SiBAR performance parameters, which cannot be obtained from the analytical model, e.g., the relationship between the transduction area and the insertion loss. Comparisons with the measurements taken on a set of silicon resonators fabricated using electron-beam lithography show that both models can predict the resonance frequencies of SiBARs with a relative error, which, in most cases, is significantly smaller than 1%.
Keywords :
acoustic wave propagation; elastodynamics; electronic engineering computing; finite element analysis; lithography; microcavities; micromechanical devices; silicon; surface acoustic wave resonators; SiBAR performance parameters; acoustic wave propagation; capacitive silicon bulk acoustic resonators; device capacitive gaps; electromechanical transduction; electron beam lithography; finite element multiphysics simulation; insertion loss; lamb wave propagation; linear elastodynamic equations; orthotropic material; rectangular-bar geometry; rectangular-bar silicon resonators fabrication; resonance frequencies; resonant modes; Computer-aided analysis; microresonators; modeling; simulation;
fLanguage :
English
Journal_Title :
Microelectromechanical Systems, Journal of
Publisher :
ieee
Conference_Location :
6/21/2010 12:00:00 AM
ISSN :
1057-7157
Type :
jour
DOI :
10.1109/JMEMS.2010.2050862
Filename :
5491025
Link To Document :
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