• DocumentCode
    3561446
  • Title

    Constrained-random bitstream generation for H.264/AVC decoder conformance test

  • Author

    Cho, Jinhyun ; Choi, Soonwoo ; Chae, Soo-Ik

  • Author_Institution
    Electr. Eng. & Comput. Sci. Dept., Seoul Nat. Univ., Seoul, South Korea
  • Volume
    56
  • Issue
    2
  • fYear
    2010
  • fDate
    5/1/2010 12:00:00 AM
  • Firstpage
    848
  • Lastpage
    855
  • Abstract
    We propose a novel method of video test bitstream for the H.264/AVC decoder conformance test without using input image sequences. Although the bitstreams can be generated from encoding the natural or artificial image sequences by a reference video encoder, their function coverage is not high enough because strong spatial and temporal correlations exist in the pixels and video parameters. The proposed method employs the constrained-random techniques to produce highly randomized video parameters in its bitstream. According to the experimental results, it substantially improves the function coverage and reduces the test time compared to those of normative conformance test bitstreams. Moreover, we can also generate the arbitrary bitstreams for stress test with the extreme values in the allowable ranges of the decoder parameters.
  • Keywords
    Automatic voltage control; Decoding; Electronic equipment testing; ISO standards; Image coding; Image sequences; MPEG 4 Standard; Pixel; Semiconductor device testing; Stress; H.264/AVC decoder conformance test, Video test bitstream, Constrained-random bitstream;
  • fLanguage
    English
  • Journal_Title
    Consumer Electronics, IEEE Transactions on
  • Publisher
    ieee
  • Conference_Location
    5/1/2010 12:00:00 AM
  • ISSN
    0098-3063
  • Type

    jour

  • DOI
    10.1109/TCE.2010.5506011
  • Filename
    5506011