Title :
A novel fault diagnosis based on wavelet transform of Iddt waveform
Author :
Zhou Jianmin ; Hongbing, Xu ; Houjun, Wang
Author_Institution :
Sch. of Autom. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
Abstract :
A novel fault diagnosis algorithm based on Iddt is presented in this paper. A fault curve which contains all kinds of fault feature is used to diagnose the fault. Three methods have been employed to process the fault curve. Simulation experiments have been used to illuminate the effectiveness of the algorithms.
Keywords :
electric current measurement; fault simulation; integrated circuit testing; wavelet transforms; Iddt waveform; fault curve; fault diagnosis algorithm; wavelet transform; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Fault diagnosis; Integrated circuit testing; Neural networks; Signal analysis; Voltage; Wavelet transforms;
Conference_Titel :
Communications, Circuits and Systems, 2004. ICCCAS 2004. 2004 International Conference on
Print_ISBN :
0-7803-8647-7
DOI :
10.1109/ICCCAS.2004.1346415
