Title :
Accurate frequency standard at 1556.2 nm based on a two-photon transition in rubidium for absolute calibration of WDM systems
Author :
Latrasse, C. ; Touahri, D. ; Poulin, M. ; Allard, M. ; Tetu, M. ; Bernard, J.E. ; Madej, A.A. ; Siemsen, K.J. ; Marmet, L.
Author_Institution :
Dept. de Genie Electr. & Genie Inf., Laval Univ., Que., Canada
Abstract :
A high accuracy frequency standard at 1556.2 nm (192.6 THz) is developed for absolute calibration within WDM systems. Measurements of frequency stability of 2.5/spl times/10-13t1/2 and absolute frequency traced down to Cs-primary frequency standard to an accuracy of n/spl tilde/0.5 kHz are presented.
Keywords :
calibration; frequency standards; rubidium; two-photon processes; wavelength division multiplexing; 1556.2 nm; Cs; Cs-primary frequency standard; Rb; WDM systems; absolute calibration; absolute frequency; accurate frequency standard; frequency stability; high accuracy frequency standard; rubidium; two-photon transition; Frequency; Laser feedback; Laser theory; Laser transitions; Measurement standards; Nonlinear optics; Optical feedback; Optical harmonic generation; Optical transmitters; Wavelength division multiplexing;
Conference_Titel :
Optical Fiber Communication Conference, 2000
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
1-55752-630-3
DOI :
10.1109/OFC.2000.868243
