Title :
A Low-Power Hybrid RO PUF With Improved Thermal Stability for Lightweight Applications
Author :
Yuan Cao ; Le Zhang ; Chip-Hong Chang ; Shoushun Chen
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
Abstract :
Ring oscillator (RO)-based physical unclonable function (PUF) is resilient against noise impacts, but its response is susceptible to temperature variations. This paper presents a low-power and small footprint hybrid RO PUF with a very high temperature stability, which makes it an ideal candidate for lightweight applications. The negative temperature coefficient of the low-power subthreshold operation of current starved inverters is exploited to mitigate the variations of differential RO frequencies with temperature. The new architecture uses conspicuously simplified circuitries to generate and compare a large number of pairs of RO frequencies. The proposed nine-stage hybrid RO PUF was fabricated using global foundry 65-nm CMOS technology. The PUF occupies only 250 μm2 of chip area and consumes only 32.3 μW per challenge response pair at 1.2 V and 230 MHz. The measured average and worst-case reliability of its responses are 99.84% and 97.28%, respectively, over a wide range of temperature from -40 to 120 °C.
Keywords :
CMOS integrated circuits; low-power electronics; oscillators; thermal stability; challenge response pair; chip area; current-starved inverters; differential RO frequency; global foundry CMOS technology; improved thermal stability; lightweight application; low-power hybrid RO PUF; low-power subthreshold operation; negative temperature coefficient; nine-stage hybrid RO PUF; noise impacts; power 32.3 muW; ring oscillator-based physical unclonable function; temperature -40 degC to 120 degC; temperature stability; temperature variation; Inverters; Radiation detectors; Semiconductor device measurement; Temperature measurement; Thermal stability; Transistors; Hardware security; Physical Unclonable Function; hardware security; physical unclonable function (PUF); process variation; ring oscillator; ring oscillator (RO); temperature stability;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2015.2424955