Statistical distributions of electromigration induced failures and their impact on reliability prediction and design

In electromigration failure studies it is generally assumed that electromigration induced failures may be adequately modelled by a log normal distribution. In order to examine the applicability of the logarithmic distribution of extreme values in electromigration a novel model was created, using an object oriented and fully 2-dimensional electrical and thermal sub-models. The repeated simulations performed showed that the log extreme value distribution is a better statistical model for electromigration failures. The significance of such a modelling is particularly apparent in electromigration failure rate prediction