Title :
Optical imaging over a plasmonic thin film with deep-subwavelength surface roughness
Author :
Leung Tsang ; Kung-Hau Ding ; Duvelle, Philippe N. ; Vella, Jarrett H. ; Goldsmith, John ; Devlin, Christie L. H. ; Limberopoulos, Nicholaos I.
Author_Institution :
Dept. of Electr. Eng., Univ. of Washington, Seattle, WA, USA
Abstract :
Subwavelength imaging has been reported for a layer of plasmonic thin film. In this paper, we investigate the enhancement of the sub-diffraction-limit imaging using subwavelength surface roughness. Full wave simulations are carried out based on Lippmann Schwinger equation with linearized scattering potentials. Progresses in experiment are also reported.
Keywords :
image processing; optical films; surface roughness; Lippmann Schwinger equation; deep-subwavelength surface roughness; full wave simulations; linearized scattering potentials; optical imaging; plasmonic thin film; sub-diffraction-Iimit imaging; Equations; Optical imaging; Optical surface waves; Rough surfaces; Scattering; Spectral analysis; Surface roughness;
Conference_Titel :
Aerospace and Electronics Conference, NAECON 2014 - IEEE National
Print_ISBN :
978-1-4799-4690-7
DOI :
10.1109/NAECON.2014.7045772
