• DocumentCode
    3564431
  • Title

    Optical imaging over a plasmonic thin film with deep-subwavelength surface roughness

  • Author

    Leung Tsang ; Kung-Hau Ding ; Duvelle, Philippe N. ; Vella, Jarrett H. ; Goldsmith, John ; Devlin, Christie L. H. ; Limberopoulos, Nicholaos I.

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Washington, Seattle, WA, USA
  • fYear
    2014
  • Firstpage
    36
  • Lastpage
    40
  • Abstract
    Subwavelength imaging has been reported for a layer of plasmonic thin film. In this paper, we investigate the enhancement of the sub-diffraction-limit imaging using subwavelength surface roughness. Full wave simulations are carried out based on Lippmann Schwinger equation with linearized scattering potentials. Progresses in experiment are also reported.
  • Keywords
    image processing; optical films; surface roughness; Lippmann Schwinger equation; deep-subwavelength surface roughness; full wave simulations; linearized scattering potentials; optical imaging; plasmonic thin film; sub-diffraction-Iimit imaging; Equations; Optical imaging; Optical surface waves; Rough surfaces; Scattering; Spectral analysis; Surface roughness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace and Electronics Conference, NAECON 2014 - IEEE National
  • Print_ISBN
    978-1-4799-4690-7
  • Type

    conf

  • DOI
    10.1109/NAECON.2014.7045772
  • Filename
    7045772
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3564431