Title :
Qualifying pixels for attributed scattering center extraction
Author :
Farmer, Justin ; Saville, Michael A.
Author_Institution :
Dept. of Electr. Eng., Wright State Univ., Dayton, OH, USA
Abstract :
Use of co- and cross-polarization phase history data has been shown to enhance feature extraction from synthetic aperture radar (SAR) data. Recent work with the spectrum-parted linked image test uses polarization with Fourier-based peak detection to qualify pixels for attributed scattering center (ASC) extraction from SAR phase history data. Extraction of closely spaced scattering centers suffers because only the dominant scatterer can be detected resulting in incomplete information about the object. We propose an ASC extraction method based on 2D Prony method and fully polarimetric SAR phase history similar to the SPLIT algorithm. In this work, we compare the signal parameter estimation performance when using a back-projection imaging operator to that when using 2D Prony method. We also examine the performance of feature estimation using experiments of primitive shapes that could represent a complicated feature needed for target classification.
Keywords :
electromagnetic wave polarisation; electromagnetic wave scattering; feature extraction; image classification; image representation; parameter estimation; radar imaging; radar polarimetry; synthetic aperture radar; 2D Prony method; ASC feature extraction enhance; Fourier-based peak detection; SPLIT algorithm; attributed scattering center extraction; back-projection imaging; cross-polarization phase history data; feature representation; polarimetric SAR copolarization phase history data; qualifying pixel; signal parameter estimation performance; spectrum parted linked image test; synthetic aperture radar polarization; target classification; Feature extraction; Frequency estimation; History; Scattering; Signal to noise ratio; Synthetic aperture radar; joint frequency and polarization parameter; scattering center extraction; synthetic aperture radar;
Conference_Titel :
Aerospace and Electronics Conference, NAECON 2014 - IEEE National
Print_ISBN :
978-1-4799-4690-7
DOI :
10.1109/NAECON.2014.7045818