Title :
AC conductivity parameters of graphene films with THz spectroscopy
Author :
Zhang, W.-D. ; Brown, E.R. ; Pham, Phi H. O. ; Burke, P.
Author_Institution :
Depts. of Phys. & Electr. Eng., Wright State Univ., Dayton, OH, USA
Abstract :
The complex conductivity of CVD-grown graphene films between 0.1 and 1.6 THz are obtained using a non-destructive THz etalon transmittance technique. Critical parameters such as ionized-impurity scattering width and chemical potential are derived. The technique can be extended to extract the complex ac conductivity parameters of other thin conducting films or 2DEG materials with high sheet conductance.
Keywords :
CVD coatings; chemical potential; electrical conductivity; graphene; terahertz wave spectra; thin films; 2DEG materials; C; CVD-grown graphene films; THz spectroscopy; chemical potential; complex AC conductivity parameters; frequency 0.1 THz to 1.6 THz; ionized-impurity scattering; nondestructive THz etalon transmittance; sheet conductance; thin conducting films; Conductivity; Films; Fitting; Graphene; Silicon; Substrates; 2D; Graphene; THz; Transmittance; conductivity;
Conference_Titel :
Aerospace and Electronics Conference, NAECON 2014 - IEEE National
Print_ISBN :
978-1-4799-4690-7
DOI :
10.1109/NAECON.2014.7045824
