• DocumentCode
    3564581
  • Title

    Gate-level commercial microelectronics verification with standard cell recognition

  • Author

    Hsia, Leleia A. ; Lanzerotti, Mary Y. ; Seery, Michael K. ; Orlando, Len

  • Author_Institution
    Air Force Inst. of Technol., Wright-Patterson AFB, OH, USA
  • fYear
    2014
  • Firstpage
    374
  • Lastpage
    378
  • Abstract
    The DARPA TRUST program was established to address the need to verify integrated circuits (ICs). This paper explores methodologies to resolve conflicts among IC designs in prior applications of commercial software to verify designs ranging in size from 1 to 283,359 cells. Preliminary results show the capability of commercial software tools to generate test cases for evaluation.
  • Keywords
    VLSI; integrated circuit design; logic design; logic gates; IC design; TRUST; VLSI; gate-level commercial microelectronics verification; integrated circuits; standard cell recognition; Adders; Integrated circuits; Inverters; Layout; Logic gates; Software; Testing; SCR; TRUST; VLSI; microelectronics; verification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace and Electronics Conference, NAECON 2014 - IEEE National
  • Print_ISBN
    978-1-4799-4690-7
  • Type

    conf

  • DOI
    10.1109/NAECON.2014.7045839
  • Filename
    7045839
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3564581