Title :
Gate-level commercial microelectronics verification with standard cell recognition
Author :
Hsia, Leleia A. ; Lanzerotti, Mary Y. ; Seery, Michael K. ; Orlando, Len
Author_Institution :
Air Force Inst. of Technol., Wright-Patterson AFB, OH, USA
Abstract :
The DARPA TRUST program was established to address the need to verify integrated circuits (ICs). This paper explores methodologies to resolve conflicts among IC designs in prior applications of commercial software to verify designs ranging in size from 1 to 283,359 cells. Preliminary results show the capability of commercial software tools to generate test cases for evaluation.
Keywords :
VLSI; integrated circuit design; logic design; logic gates; IC design; TRUST; VLSI; gate-level commercial microelectronics verification; integrated circuits; standard cell recognition; Adders; Integrated circuits; Inverters; Layout; Logic gates; Software; Testing; SCR; TRUST; VLSI; microelectronics; verification;
Conference_Titel :
Aerospace and Electronics Conference, NAECON 2014 - IEEE National
Print_ISBN :
978-1-4799-4690-7
DOI :
10.1109/NAECON.2014.7045839
