Title :
Integrated FDTD analysis of active microwave circuits and solid state devices
Author :
Hum, P.J. ; Leong, M.S. ; Leong, H.C.
Author_Institution :
Dept. of Electr. Eng., Nat. Univ. of Singapore, Singapore
fDate :
11/1/1999 12:00:00 AM
Abstract :
An active device model is devised and coupled with the FDTD scheme for the analysis of electromagnetic effects on solid-state devices. The device model is based on the numerical solutions of semiconductor transport equations of the device. In this work, a Newton iterative method is used to solve the equations instead of employing the conventional Gummel´s method. This method is found to be much faster than the Gummel´s method in terms of computational time and convergence of the solutions, which can usually be achieved within three to four iterations. An example that simulates the transient response of a diode employing this resultant scheme is presented and the results are compared with that using the conventional lumped-element approach for active device. An application example, which simulates a single-pole double-throw (SPDT) switch using the device model proposed, is also analysed
Keywords :
finite difference time-domain analysis; iterative methods; microwave diodes; microwave switches; semiconductor device models; FDTD model; Newton iterative method; PN junction diode; active microwave circuit; electromagnetic effects; numerical simulation; semiconductor transport equation; single-pole double-throw switch; solid-state device; transient response; Coupled mode analysis; Coupling circuits; Electromagnetic coupling; Electromagnetic modeling; Equations; Finite difference methods; Microwave devices; Solid modeling; Switches; Time domain analysis;
Conference_Titel :
Microwave Conference, 1999 Asia Pacific
Print_ISBN :
0-7803-5761-2
DOI :
10.1109/APMC.1999.829889