Title :
A very low failure rate of COD free high power 0.98 /spl mu/m laser diode with the window structure
Author :
Yamamura, S. ; Hanamaki, Y. ; Kawasaki, K. ; Shigihara, K. ; Nagai, Y. ; Nlshinura, T. ; Omura, E.
Author_Institution :
High Frequency & Opt. Semicond. Div., Mitsubishi Electr. Corp., Itami, Japan
Abstract :
A very low failure rate of a 0.98 /spl mu/m laser diode is reported. COD free characteristics is realized. The cumulative failure rate 0.4% for wear-out and 5.6% for sudden failure is estimated 25 years later at 25 C-250 mW.
Keywords :
laser beams; laser reliability; ridge waveguides; semiconductor device reliability; semiconductor lasers; waveguide lasers; 0.98 mum; 25 C; 250 mW; catastrophic optical damage; catastrophic optical damage free characteristics; cumulative failure rate; failure rate; high power laser diode; laser diode; sudden failure; wear-out; window structure; Acceleration; Aging; Annealing; Degradation; Diode lasers; Optical pumping; Optical waveguides; Power generation; Stimulated emission; Temperature;
Conference_Titel :
Optical Fiber Communication Conference, 2000
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
1-55752-630-3
DOI :
10.1109/OFC.2000.868552
