DocumentCode :
3565106
Title :
Schottky-on-heterojunction optoelectronic functional devices realized on AlGaN/GaN-on-Si platform
Author :
Baikui Li ; Xi Tang ; Qimeng Jiang ; Yunyou Lu ; Hanxing Wang ; Jiannong Wang ; Chen, Kevin J.
Author_Institution :
Dept. of Electron. & Comput. Eng., Hong Kong Univ. of Sci. & Technol., Hong Kong, China
fYear :
2014
Abstract :
We demonstrated that the metal-AlGaN/GaN Schottky diode is capable of producing GaN band-edge ultraviolet (UV) emission at 3.4 eV/364 nm under forward bias larger than ~2 V at room temperature. The underlying mechanism of the hole generation/injection and electroluminescence (EL) processes in this Schottky-on-heterojunction light-emitting diode (SoH-LED) was discussed based on the impact ionization of surface states presented in the (Al)GaN barrier layer. By replacing the conventional ohmic drain with a semitransparent Schottky drain, we demonstrated an AlGaN/GaN high-electron-mobility light-emitting transistor (HEM-LET) in which the drain current and EL emission are controlled simultaneously by gate voltage. Switching operation up to 120 MHz was obtained in SoH-LED to demonstrate its potential in providing high-speed on-chip light sources on the GaN electronic device platform.
Keywords :
III-V semiconductors; Schottky diodes; aluminium compounds; electroluminescence; gallium compounds; high electron mobility transistors; light emitting diodes; ultraviolet sources; wide band gap semiconductors; AlGaN-GaN-Si; HEM-LET; Schottky diode; Schottky-on-heterojunction optoelectronic functional device; band edge ultraviolet emission; electroluminescence processes; electron volt energy 3.4 eV; high electron mobility light emitting transistor; hole generation; hole injection; light emitting diode; on-chip light sources; semitransparent Schottky drain; temperature 293 K to 298 K; wavelength 364 nm; Aluminum gallium nitride; Gallium nitride; Gold; HEMTs; MODFETs; Nickel; Schottky diodes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting (IEDM), 2014 IEEE International
Type :
conf
DOI :
10.1109/IEDM.2014.7047032
Filename :
7047032
Link To Document :
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