DocumentCode :
3565121
Title :
Sub-60 mV/decade steep transistors with compliant piezoelectric gate barriers
Author :
Jana, Raj K. ; Ajoy, Arvind ; Snider, Gregory ; Jena, Debdeep
Author_Institution :
Dept. of Electr. Eng., Univ. of Notre Dame, Notre Dame, IN, USA
fYear :
2014
Abstract :
A novel mechanism is proposed for transistors that exploits the negative differential capacitance of piezoelectric gate barriers. Electric field induced electrostriction modulates the thickness of a piezoelectric barrier. Piezoelectricity and electrostriction in a compliant piezoelectric barrier combine to provide negative differential capacitance (NDC) with internal charge amplification. The effect of the NDC in the gate capacitor of a FET is to boost the on-current, and to provide an opportunity for switching steeper than the 60 mV/decade Boltzmann limit, both highly desirable.
Keywords :
electrostriction; field effect transistors; piezoelectric devices; Boltzmann limit; FET; electric field induced electrostriction modulation; internal charge amplification; negative differential capacitance; piezoelectric barrier; piezoelectric gate barriers; steep transistor; Capacitance; Capacitors; Logic gates; Materials; Strain; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting (IEDM), 2014 IEEE International
Type :
conf
DOI :
10.1109/IEDM.2014.7047047
Filename :
7047047
Link To Document :
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