DocumentCode :
3565172
Title :
A self-sustained nanomechanical thermal-piezoresistive oscillator with ultra-low power consumption
Author :
Kuan-Hsien Li ; Cheng-Chi Chen ; Ming-Huang Li ; Sheng-Shian Li
Author_Institution :
Inst. of NanoEngineering & Microsyst., Nat. Tsing Hua Univ., Hsinchu, Taiwan
fYear :
2014
Abstract :
This work reports wing-type thermal-piezoresistive oscillators operating at around 840 kHz in vacuum with ultra-low power consumption of only 70 μW for the first time. The combination of N-type heavily doped silicon with negative piezoresistive coefficients and sub-micron cross-sectional dimensions of the thermally actuated beams is key to ensuring self-sustained oscillation under sub-100μW level. In particular, shrinking thermal beam cross-sections in 2D is a novel and effective approach to achieve better figure of merit (e.g., FOM defined by the ratio of transconductance gm to dc power consumption PDC) of the self-sustained oscillators. By using proper control of silicon etching (ICP) recipe, the sub-micron cross-sectional dimensions of the thermally actuated beams can be easily and reproducibly fabricated in one process step. The phase noise of the proposed wing-type oscillators is also investigated in this work with -93.41 dBc/Hz at 1-kHz offset and -97.95 dBc/Hz at 100-kHz offset in air, and -95.9 dBc/Hz at 1-kHz offset and -95.7 dBc/Hz at 100-kHz offset in vacuum, respectively.
Keywords :
etching; micromechanical devices; nanoelectromechanical devices; oscillators; phase noise; piezoresistive devices; silicon; N-type heavily doped silicon; Si; nanomechanical thermal-piezoresistive oscillator; negative piezoresistive coefficient; phase noise; power 70 muW; self-sustained oscillation; silicon etching; submicron cross-sectional dimension; thermally actuated beam; ultra-low power consumption; wing-type thermal-piezoresistive oscillator; Frequency measurement; Phase noise; Power demand; Resistance; Resonant frequency; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting (IEDM), 2014 IEEE International
Type :
conf
DOI :
10.1109/IEDM.2014.7047099
Filename :
7047099
Link To Document :
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