Title :
The reduction of switching VR impact on PCB signals
Author :
Yinglei Ren ; Wei Shen ; Chang, Patt ; Li, Y.L.
Author_Institution :
Intel Asia-Pacific R&D Ltd., Shanghai, China
Abstract :
Noise caused by switching voltage regulator (VR noise) can have big impact on system performance, causing signal integrity (SI) / power integrity (PI) issues. This paper introduces systematic ways of reducing VR noise at source, in coupling path and at receiver. Examples are also shared.
Keywords :
printed circuits; voltage regulators; PCB signals; PI; SI; VR noise; coupling path; power integrity; receiver; signal integrity; switching VR impact reduction; switching voltage regulator; system performance; IEEE catalog; defensive circuit; noise coupling; noise reduction; noise-aware VR design; voltage regulator noise (VR noise);
Conference_Titel :
Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2014 9th International
DOI :
10.1109/IMPACT.2014.7048365
