Title :
MRC training vs. board defect
Author :
Lai, Dirack ; Chen, Arthur ; Li, Y.L.
Author_Institution :
Data Center Platform Applic. Eng., Intel Asia-Pacific R&D Ltd., Taipei, Taiwan
Abstract :
Using debug experiments to prove the concept, we correlated failures in the MRC training log with board defects and, in doing so, established a new usage model for MRC board defect capture flow/methodology. We helped customers identify board defect locations by conducting PCB cross-sectional analysis at those locations. This resulted in PCB vendor process improvement by avoiding random board defects. Our MRC training analysis for board defect capturing on DDR nets can apply to any DDR relative design, especially those designs with DRAM chips device down. This methodology/flow fits into the validation process during both production and post-production. It helps customers avoid the high cost of product callback and penalty. The main difficulty is in convincing PCB vendors to do PCB cross-sectional analysis themselves to identify defects in their manufacturing process.
Keywords :
DRAM chips; printed circuit testing; DDR nets; DDR relative design; DRAM chips device down; MRC board defect capture flow; MRC training log; PCB cross-sectional analysis; PCB vendor process improvement; board defect capturing; board defect location identification; debug experiments; manufacturing process; memory reference code; random board defects; usage model; Built-in self-test; Integrated circuit interconnections; Mobile handsets; Production; Random access memory; Reliability; Training;
Conference_Titel :
Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2014 9th International
DOI :
10.1109/IMPACT.2014.7048403