DocumentCode :
3565922
Title :
Three dimensional auto meshing flexibility CAE analysis for microchip encapsulation
Author :
Lung-Chi Chen ; Chih-Chung Hsu ; Dar-Der Hsieh ; Rong-Yeu Chang
Author_Institution :
CoreTech Syst. (Moldex3D) Co., Ltd., Chupei, Taiwan
fYear :
2014
Firstpage :
134
Lastpage :
137
Abstract :
The development of microchip product is complicated due to the complexity of material properties while processing. This process contains the interconnection between microchips and other electronics (so-called wire bonding), curing phenomenon of thermoset material, and various control management of process conditions. With the complexity of multiple material components, such as EMC, chip, or lead frame, and high wire density, many challenges and uncertainty have been brought to the Chip Encapsulation process. CAE technology has provides a more scientific way to help people solving the problems and enhance the development. However, while the microchip product is getting more complex, it´s not easy for a designer to build up a mesh model for the CAE analysis efficiently. In view of this fact, this paper develops an innovative parallel true 3D mold filling simulation technology, which allows for the adoption of automatic mesh generation technique. The auto meshing tools simplify the model creation with prismatic control and allow designers to validate designs efficiently. The proposed methodology has allowed the user to perform analyses in much less time on complex model with flexible meshing and parallel processing capabilities. By using the integrated analysis, the developed approach proved from numerical experiments to be a cost-effective method for 3D simulation of molding process in microchip encapsulation.
Keywords :
curing; encapsulation; integrated circuit interconnections; lead bonding; microprocessor chips; moulding; 3D mold filling; CAE analysis; EMC; automatic mesh generation; control management; curing phenomenon; flexible meshing; microchip encapsulation; microchip interconnection; molding process; multiple material components; parallel processing; prismatic control; thermoset material; three dimensional auto meshing flexibility; wire bonding; Analytical models; Encapsulation; Filling; Fluids; Numerical models; Solid modeling; Three-dimensional displays;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2014 9th International
Type :
conf
DOI :
10.1109/IMPACT.2014.7048432
Filename :
7048432
Link To Document :
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