DocumentCode
3565927
Title
Applications of Ag-alloy stud bump for IC and LED packages
Author
Hsing-Hua Tsai ; Chih-Hsin Tsai ; Jun-Der Lee ; Chang, Dennis ; Yu-Ting Shih ; Chun-Hao Chen ; Tung-Han Chuang
Author_Institution
Wire Technol. Co., Ltd., Taichung, Taiwan
fYear
2014
Firstpage
49
Lastpage
52
Abstract
Recently, 3-D IC and 2.5-D IC packages become more popular and Cu pillars are often employed as their conductive bumps. However, since the Cu pillars are hard and rigid, it is difficult to plastically deform for the solid contact between the Cu pillars and bonding pads during the assembly process utilizing hot pressing. In this case, a coplanar problem may occur, which leads to voids or even failure at the bonding interfaces. The Ag-alloy wires previously developed by Wire Technology Co., LTD., have been further manufactured as stud bumps for flip-chip interconnections. This innovative Ag alloy stud bump is softer, so it is able to plastically deform during hot pressing to be in solid contact with the on-substrate bonding pad, preventing the coplanar problem of Cu pillars in 3D- or 2.5D-IC packages. The Ag-alloy stud bumps also exhibit many other advantages for applications in advanced IC and high power flip chip packages as comparing with the conventional Au- or Cu- stud bumps.
Keywords
copper alloys; flip-chip devices; hot pressing; integrated circuit bonding; integrated circuit packaging; light emitting diodes; silver alloys; three-dimensional integrated circuits; 2.5D IC packages; 3D IC packages; Ag; Cu; LED packages; assembly process; bonding interfaces; conductive bumps; coplanar problem; flip-chip interconnections; high power flip chip packages; hot pressing; on-substrate bonding pad; silver-alloy stud bump; solid contact; Bonding; Flip-chip devices; Gold; Intermetallic; Silver; Wires; 2.5D IC package; Ag alloy wire; High-power LED package; Stud bump;
fLanguage
English
Publisher
ieee
Conference_Titel
Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2014 9th International
Type
conf
DOI
10.1109/IMPACT.2014.7048435
Filename
7048435
Link To Document