• DocumentCode
    3566182
  • Title

    Circuit-level characterization and loss modeling of SiC-based power electronic converters

  • Author

    Ravi, Lakshmi ; Severson, Eric L. ; Tewari, Saurabh ; Mohan, Ned

  • Author_Institution
    Univ. of Minnesota, Minneapolis, MN, USA
  • fYear
    2014
  • Firstpage
    1291
  • Lastpage
    1297
  • Abstract
    This paper presents the design, characterization, and modeling of a power electronic converter based around Silicon Carbide (SiC) MOSFETs. A practical characterization procedure is proposed which takes a circuit-level approach, as opposed to a device-level approach, using only the power electronic circuit and no additional test circuitry. The converter circuit is general enough that it can represent a dc chopper circuit or an output phase of an inverter. The design of the converter, including the SiC-specific gate drive circuit, is described. The hardware setup was operated at frequencies up to 200 kHz and efficiencies up to approximately 99% were recorded. A model for predicting converter and driver losses at different load currents, dc bus voltages, and operating temperatures was constructed; the predictions from the model were in good agreement with the measurements.
  • Keywords
    MOSFET; invertors; power electronics; silicon compounds; SiC; circuit-level approach; circuit-level characterization; device-level approach; driver losses; frequency 200 kHz; load currents; loss modeling; power electronic circuit; power electronic converters; silicon carbide MOSFET; Integrated circuit modeling; Logic gates; MOSFET; Resistance; Switches; Temperature measurement; Voltage measurement; SiC device; gate drive; loss estimation; practical characterization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics Society, IECON 2014 - 40th Annual Conference of the IEEE
  • Type

    conf

  • DOI
    10.1109/IECON.2014.7048668
  • Filename
    7048668