DocumentCode
3566191
Title
Current sharing model of parallel connected IGBTs during turn-on
Author
Yawei Xiao ; Qinwei Liu ; Yunyu Tang ; Li Du ; Hao Ma
Author_Institution
Coll. of Electr. Eng., Zhejiang Univ., Hangzhou, China
fYear
2014
Firstpage
1350
Lastpage
1355
Abstract
Paralleled IGBTs have drawn much attention to increase current capability in high power applications. However, the current imbalance must be carefully concerned, which is caused by device characteristic difference and asymmetric circuit. In this paper, a current sharing model during turn-on period is proposed on the basis of parameterized IGBT model. The discrepancy of device parameters can lead to the difference of turn-on delay time, then, the influence of different device parameters on current sharing can be analyzed quantitatively according to the model. Moreover, the model can be used to predict the mismatch of current sharing, and the compensation of delay time can be obtained directly when active gate control method is applied. Finally, the model is verified by the experiments of two parallel connected IGBT modules (1200V, 300A) with a high accuracy. And the application of this model is also presented in the paper.
Keywords
delays; insulated gate bipolar transistors; current sharing mismatch prediction; current sharing model; delay time compensation; parallel connected IGBT; parameterized IGBT model; turn-on delay time; Capacitance; Current measurement; Delays; Insulated gate bipolar transistors; Logic gates; Switches; Threshold voltage; IGBT; current sharing model; paralled; turn-on delay time;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics Society, IECON 2014 - 40th Annual Conference of the IEEE
Type
conf
DOI
10.1109/IECON.2014.7048677
Filename
7048677
Link To Document