Title :
Low loss and low noise gate driver for SiC-MOSFET with gate boost circuit
Author :
Yamaguchi, Koji ; Sasaki, Yuji ; Imakubo, Tomofiimi
Author_Institution :
Dept. of Electr. Syst., IHI Corp., Tokyo, Japan
Abstract :
This paper presents low-switching-loss and low-switching-noise gate driver for Silicon-Carbide (SiC) - Metal-Oxide-Semiconductor Field-Effect-Transistor (MOSFET) with gate boost circuit which is very simple and cost-effective. Compared to a conventional gate drive circuit, the proposed gate driver has capability of reducing the switching losses and switching time without increasing switching noise. SiC power devices have attracted huge interest as next generation power devices. Normally, switching losses and switching noise have some trade-off each other, SiC devices are expected to switch fast for low switching losses but fast switching might cause switching noise problem such as electromagnetic interferences (EMI). We have confirmed that the proposed gate driver makes it possible to drive SiC-MOSFET fast and energy efficiently without increasing switching noise and break the trade-off of switching characteristics.
Keywords :
electromagnetic interference; power MOSFET; silicon compounds; EMI; electromagnetic interferences; gate boost circuit; low-switching loss gate driver; low-switching noise gate driver; next generation power devices; silicon carbide MOSFET; silicon carbide power devices; silicon-carbide metal-oxide-semiconductor field-effect-transistor; switching loss reduction; switching noise; switching time reduction; Delays; Logic gates; Noise; Silicon carbide; Switches; Switching circuits; Switching loss; Electromagnetic interference (EMI); Metal-Oxide-Semiconductor Field-Effect-Transistor (MOSFET); Silicon-Carbide (SiC); gate drive; switching loss;
Conference_Titel :
Industrial Electronics Society, IECON 2014 - 40th Annual Conference of the IEEE
DOI :
10.1109/IECON.2014.7048715