Title :
Software changes in factory automation: Towards automatic change based regression testing
Author :
Ulewicz, Sebastian ; Schutz, Daniel ; Vogel-Heuser, Birgit
Author_Institution :
Inst. of Autom. & Inf. Syst., Tech. Univ. Munchen, Munich, Germany
Abstract :
Changes of software in factory automation are frequent and resource-consuming in quality assurance when proving compliance with functional specifications. Automated testing can help minimizing required resources for software engineering. However, changes in the software cause a need for re-evaluating functionality through tests. To reduce resource consumption, existing relevant tests can be re-executed after ensuring their compatibility with the software after the changes. In this paper, an approach for enabling the automatic identification and classification of changes is presented, which can be used to efficiently select existing and help adapting incompatible test cases, leading to an overall increase in test efficiency. The approach is based on a detailed Programmable Logic Controller (PLC) program library and code analysis (both in IEC 61131-3) for several types of machines of industrial companies from the domain of factory automation.
Keywords :
factory automation; program diagnostics; program testing; programmable controllers; quality assurance; regression analysis; software libraries; software quality; IEC 61131-3; PLC program library; automated testing; automatic change based regression testing; code analysis; factory automation; functional specification; industrial company; programmable logic controller program; quality assurance; resource consumption; software compatibility; software engineering; IEC standards; Manufacturing automation; Object oriented modeling; Software; Testing; Unified modeling language; Manufacturing systems; automatic control; change classification; change detection; programmable logic controllers; quality control; software engineering; test selection;
Conference_Titel :
Industrial Electronics Society, IECON 2014 - 40th Annual Conference of the IEEE
DOI :
10.1109/IECON.2014.7048875