DocumentCode :
3566644
Title :
Geometry and bias current optimization for SiGe HBT cascode low-noise amplifiers
Author :
Qingqing Liang ; Guofu Niu ; Cressler, John D. ; Taylor, S. ; Harame, D.L.
Author_Institution :
Electr. & Comput. Eng. Dept., Auburn Univ., AL, USA
Volume :
1
fYear :
2002
Firstpage :
517
Abstract :
This work presents a new design methodology for inductively-degenerated cascode low-noise amplifiers using advanced epitaxial-base SiGe HBTs. Noise figure, gain, and IIP3 are calculated using calibrated linear circuit analysis and a Volterra series methodology as a function of the two major design variables: emitter geometry and biasing current. An optimum SiGe HBT LNA design point which balances input impedance match, high IIP3, noise figure, gain, and power consumption is obtained from calculated noise figure, gain, and IIP3 contours as a function of bias current and geometry. Simplified analytical expressions of IIP3, gain, and noise figure are presented to give additional insight. The optimum LNA design point for the 50 GHz SiGe HBT process technology under study yields a 2 GHz LNA with 15.8 dBm IIP3, 18 dB gain, 1.15 dB noise figure, and a |s11| less than -20 dB for a biasing current of 7.5 mA. The calculated results show good agreement with HP Advanced-Design-System simulations. The design tradeoffs illuminated by this optimization methodology are highlighted and discussed.
Keywords :
Ge-Si alloys; UHF amplifiers; UHF integrated circuits; Volterra series; bipolar analogue integrated circuits; circuit optimisation; impedance matching; integrated circuit design; integrated circuit noise; linear network analysis; semiconductor materials; 1.15 dB; 18 dB; 2 GHz; 50 GHz; 7.5 mA; IIP3; SiGe; SiGe HBT cascode low-noise amplifiers; Volterra series methodology; bias current optimization; biasing current; calibrated linear circuit analysis; design methodology; design tradeoffs; emitter geometry; epitaxial-base SiGe HBTs; gain; geometry optimization; inductively-degenerated cascode low-noise ampli&rs; input impedance match; noise figure; optimum LNA design point; power consumption; Circuit analysis; Design methodology; Geometry; Germanium silicon alloys; Heterojunction bipolar transistors; Impedance; Linear circuits; Low-noise amplifiers; Noise figure; Silicon germanium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2002 IEEE MTT-S International
ISSN :
0149-645X
Print_ISBN :
0-7803-7239-5
Type :
conf
DOI :
10.1109/MWSYM.2002.1011670
Filename :
1011670
Link To Document :
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